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All KUBTEC® Scientific instruments have a feature called Automatic Exposure Control (AEC) built into our standard DIGICOM pre- and post-image-processing software. When imaging a novel sample where the optimal imaging parameters have yet to be determined, AEC will automatically set imaging parameters based on a quick 'scout' image, that allows users to achieve 1-click imaging for faster through-put.
In some instances, users may wish to further optimize an image based on their own imaging goals. Having the option to perform manual optimization techniques empowers any user to obtain the visual information they need quickly and easily.
KUBTEC X-ray systems have easy operation that allows for manual image optimization when desired. Keeping some simple X-ray imaging principles in mind can help achieve the ideal level of detail and contrast.
In our previous email, we noted that there are three imaging parameters that can be changed in KUBTEC X-ray systems: kV, μA, and magnification. We discussed how changing kV affects the exposure of your image, and changing μA impacts the contrast and background noise of your image.
In this email, we'll discuss how changing magnification will affect your image.
We all know an object placed in the path of light will project a shadow onto a surface. When the object is moved closer to the light source and the shadow appears larger than the object, this is because the light from the source, such as a lightbulb, travels in all directions, spreading out from the source. Likewise, if the object is moved farther from the lightbulb and closer to the projection surface, the shadow will appear closer to the actual size of the object. This is called divergent light.
In the same way, X-ray beams travel in all directions from an X-ray source and therefore are also divergent. Unlike light, higher energy X-ray beams are able to pass through an object placed in their path as they continue to diverge. The beams are projected onto an X-ray detector, which translates the incident beams into pixels that form an image of the object in their path.
However, changing the image magnification will also have consequences for the clarity of the image, but a balance may be found based on the goals of the imaging session.
Because X-ray magnification relies on geometric projection, the divergent beams will continue to spread when the distance between the object and the detector is increased. The divergent nature of the X-ray beams will inevitably reduce image clarity to some degree by increasing geometric blur. Reducing the magnification (i.e., decreasing the object-to-detector distance) will increase the clarity of the image because there is less distance for the beams to diverge between the object and the detector.
To be clear, these magnification adjustments affect image clarity and not resolution:
Resolution is limited by the hardware in the system, while clarity is dependent upon resolution as well as other factors that can generally be optimized by the user.
Thus, the power and sensitivity of the instrument components (i.e. source kV and detector focus) are key when choosing an X-ray system. X-ray components must be capable of capturing and generating high-resolution images, otherwise no amount of image optimization can compensate when detailed information is lacking from the start.
And as always, when optimizing images, only one variable at a time should be changed. This is the best way to determine the optimal imaging parameters for a specific sample.